UNIT 16 β’ MASKS, OVERLAY, AND SCANNERS
The scanner shrinks the image 4Γ
Drawing and inspecting a mask is far easier when its features are four times larger than the final ones. The projection lens shrinks the reticle image by 4Γ onto the wafer. Tiny errors on the reticle are reduced by the same factor, which helps too.
STEP AND SCAN
How one shot covers the wafer
OVERLAY
Every layer must land on the last one
Each layer's pattern has to sit exactly on top of the layers below it. Special alignment marks in the scribe lines between dies let the scanner measure where the wafer is. Overlay budgets are a small fraction of the smallest feature, so at advanced nodes they are only a few nanometers.
MASK TRICKS
The mask does not look like the design
OPC
Optical proximity correction adds tiny serifs and assist features so light prints the intended shape
Phase-shift masks
Shift the light's phase to sharpen contrast at feature edges
Off-axis illumination
Tilts the light so fine patterns diffract better into the lens
Computational litho
Software simulates the whole imaging process to design the mask
THE PELLICLE
A dust cover for the reticle
A pellicle is a thin transparent membrane stretched a few millimeters above the mask. A particle that lands on it sits far out of the focal plane, so it blurs away instead of printing. Without one, a single speck on the reticle could be copied onto every die.
MASK COST
One reticle defect prints everywhere
UNIT 16 STUDY COMPLETE
Ready for the Fab Challenge?
You can explain reduction optics, overlay, and how masks get corrected.