DIES PER WAFER
Big squares on a round wafer
A 300 mm wafer has about 70,000 mmยฒ of area. Big square dies waste more of the round edge, so a wafer yields only about 60 to 70 candidate dies of H100 size, compared with hundreds of smaller phone chips.
YIELD
Defects land at random
Tiny particles and pattern faults land randomly across the wafer. A die is good only if no killer defect lands on it. In a simple Poisson model, yield = eโD ร A, where D is the defect density and A is the die area.
FIGHTING BACK
Spares and harvesting
Redundancy
Build in spare SMs or cores; the H100 die has 144 SMs but ships with at most 132 enabled
Binning
Sell dies with a few faults as lower-tier products
Known-good die
Test every chiplet before packaging so one bad die doesn't waste a package
THE BILL
What goes into the price
DESIGN COST
Paying for the design
Designing a leading-edge chip can cost hundreds of millions of dollars in engineers, software tools, masks and test runs. A full mask set alone for the newest nodes costs many millions. That cost is spread over every chip sold, so only high-volume or high-value chips justify it.
UNIT 13 STUDY COMPLETE
Ready for the Fab Challenge?
You've seen how defect density and die size set the yield, and why big AI dies are so expensive.